Functional Electronic Clones & China’s plan to Dominate the Semiconductor-Manufacturing Industry

December 12, 2018 @ 5:30 pm – 7:30 pm America/New York Timezone
MIT Lincoln Laboratory
3 Forbes Rd
Lexington, MA 02421

Reliability Society

The first half of the presentation will focus on the relatively recent appearance of cloned electronic components within global supply chains. The entire electronics industry is now facing a much more insidious counterfeit threat than at any time in the past. The existence of cloned electronic components bearing the markings of major component manufacturers in today’s global supply chains has been clearly established within SMT’s labs over the past 6 years.

The most worrisome aspect of these “made from scratch” fakes is their ability to easily pass current inspection processes AND electrical testing to the manufacturers data sheet. The presentation will focus on several actual examples of this most concerning advanced counterfeiter capability and some of the cutting-edge processes utilized by SMT as an obsolescence component supplier and testing lab to mitigate this new and growing threat from making it to our OEM, EMS & CM customers.

The 2nd half of the presentation will focus on the current state and future OEM/End-User implications of Chinas’ “Home-grown Chips” initiative targeting the semiconductor manufacturing industry over the next 2-5 years.

Both of these presentation focal points will be discussed in the context of their predictable future effects on the entire “Hi-Reliability” Electronics Industry.

Tom Sharpe

Tom Sharpe is Executive Vice President of SMT Corporation which maintains the largest inventory of obsolete & DMS-type electronic components within the U.S. – as well as the largest in-house authentication and electrical testing service capability within the Independent Distribution sector.

Tom is a founding member of the SAE G-19 AS6081 committee which is continuing to develop new inspection and process standards in the fight against counterfeit electronic components in global supply chains.

SMT’s labs are credited with the initial identification and industry-sharing of several counterfeit processes over the past several years as well as developing the required mitigation inspections to reliably detect these new counterfeiting methods.

In 2011 Tom was requested to provide subject-matter-expert (SME) testimony before the formal Senate Armed Services Committee (SASC) hearings on counterfeit electronic components within DOD supply chains.

In 2012 SMT labs were credited with being the first to identify the newest threat from China – “made from scratch” functional cloned electronic component devices within global supply chains.

Tom’s presentations serve to educate all sectors of the electronics industry about the growing dangers of counterfeits in today’s market and best practices to reliably detect and mitigate these constantly evolving dangers.

MEETING LOCATION: MIT Lincoln Laboratory, 3 Forbes Rd, Lexington, MA, 02421

Registration: click here

Directions to 3 Forbes Road, Lexington, MA:

• Take Route 128/I-95 to Exit 30B, Route 2A Westbound.
• At the first traffic light, turn left onto Forbes Road.
• Go to the end of the street.
• At the traffic circle, turn right.
• Go halfway around the traffic circle and turn into the parking lot for MIT Lincoln Laboratory
• The main entrance is straight ahead, shared with “agenus”.