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IEEE-Ansys Reliability Tutorial Series – Accelerated Life Testing for Electronics Reliability 

When:
May 29, 2024 @ 7:00 am America/New York Timezone
2024-05-29T07:00:00-04:00
2024-05-29T07:15:00-04:00
Where:
On-Line

This tutorial is available on demand starting May 29, 2024

You will have 180 days to access this on-line course.

Course Fee Schedule: Registration is On-Going

Cost: $70.00

Refund Policy:  No refunds for online courses once the course is accessed by the attendee.

Course Summary

Whether in the defense, healthcare, consumer electronics, or communication industries, performing electronic packaging reliability demonstration tests is a crucial part of the design process. This webinar will cover a wide range of accelerated life tests (ALT), including ALT tests at the device level to determine characteristic life, highly accelerated life tests (HALT) to determine design flaws, highly accelerated stress screens (HASS) to catch manufacturing defects, and board level reliability tests (BLTR) to demonstrate product reliability. The discussion of each test will include a definition of the test, recommendations on how to design and complete the test, and how to process the results. The lecture is focused on electronics reliability and will use electronics examples to aid in the discussion.

This presentation is the second part of a two-lecture mini-series covering electronics reliability validation testing. The previous lecture focused on developing a fundamental background of electronics failures. This lecture will focus on using those fundamentals to develop validation tests based.

TAKEAWAYS:

  • How to use accelerated life testing to predict product life in the field.
  • Understanding the differences between the different ALT test – ALT/HALT/HASS/BLRT
  • How to develop a reliability demonstration test.

 BIO:  Dr. Jon Kordell, Phd

Jonathan Kordell is a Senior Reliability Consulting Engineer at Ansys with 8 years of experience in electronic packaging reliability, accelerated testing and failure analysis. His current role is focused on the reliability of electronic devices in a range of environments via a combination of physical characterization and analytical modeling including finite element analysis. Jonathan received his PhD in mechanical engineering from the University of Maryland at the Center for Advanced Life Cycle Engineering (CALCE).

We can offer Continuing Education Units (CEU) and Professional Development Hours (PDH), if requested.  A small fee may apply for the credits.