Reliability Chapter

This event will be hybrid, but we encourage in-person attendance. Registration is free, but it is required so that we can plan pizza, salad, and beverages.

Location:  MIT Lincoln Laboratory, 244 Wood St, Lexington, Massachusetts.  Building: Main Cafeteria

Zoom: TBD

When arriving Wednesday evening, please be prepared to show a government-issued photo ID, such as a driver’s license, at the main gate at Wood Street. State that you are attending the IEEE Reliability meeting in the Main Cafeteria.

After parking, walk towards the main building near the flagpole. Before entering, look left, and walk down the steps. At the bottom of the steps, turn right. Walk straight through the double set of double doors and straight into the Main Cafeteria.

Agenda:

5:00 pm doors open, for networking. Arriving earlier is ok.

5:30 pm: Dinner and refreshments are scheduled to arrive, while networking continues.

6:00 pm: Introduction to the presentation, followed by the formal presentation.

Between 7 and 7:30 pm: Formal presentation and formal Q&A end.

8:00 pm: Informal Q&A and networking end.

Speaker: Dr. Charles H Recchia, Senior Manager of Quality and Reliability, ASMPT NEXX, Billerica, MA.

• As a follow-up from the March 2022 Boston Chapter presentation, we present updates on the adoption of neutral prior corrections to widely used reliability and quality estimation and test planning methods.
• In addition to conference presentations and podcast episode coverage, and a citation in a popular reliability engineering textbook, we review current status on inclusion of the correction into various engineering standards.
• We also present additional details into the statistical and mathematical underpinnings of the foundational 2021 IIRW workshop paper formulae.

Biography: Dr. Charles H Recchia, Senior Manager of Quality and Reliability, ASMPT NEXX, Billerica, MA.

• Charles H Recchia, has held technology development, reliability engineering and director-level positions at AMD, Intel Corporation, MKS Instruments, Saint-Gobain, Raytheon Integrated Defense Systems, MACOM, and currently ASMPT NEXX.
• D. in Experimental Solid-State Physics from Ohio State University.
• MBA from Babson College
• Visiting academic appointments: Wittenberg University and Worcester Polytechnic Institute
• Author of 3 semiconductor technology patents
• 20+ peer-reviewed publications
• Senior Member of IEEE
• Served 3-year extended term as IEEE Reliability Boston Chapter Chair, 2015-2017

Registration:  https://events.vtools.ieee.org/m/555718

Looking forward to seeing you in person!

Dan Weidman

Chair, IEEE Boston Reliability Chapter