Reliability Growth Test Planning and Data Analysis: What are the Real Final Results?

Reliability growth of hardware through test and analysis has been a valuable industry tool for improvement of reliability of products for several decades. To provide a measure of this improvement, several mathematical models have been developed. Two of the well-known models for planning and monitoring of reliability growth are Duane, known as graphical methodology, and AMSAA /CROW, known as analytical model. Regardless, the fact is that the two models are based on the same principle, but contain a serious error in planning of the test duration and consequently in test data analysis, reporting of the results, and the measure of reliability improvement. The presentation will show how this mathematical — and also theoretical — error, unaddressed for decades, leads to incorrectly planned test duration and unrealistic overestimate of achieved reliability improvement.

Milena Krasich of Raytheon IDS

Milena Krasich is a Senior Principal Systems Engineer in Raytheon Integrated Defense Systems, Whole Life Engineering in RAM Engineering Group, Marlborough, MA. Prior to joining Raytheon, she was a Senior Technical Lead of Reliability Engineering in Design Quality Engineering of Bose Corporation, Automotive Systems Division after her five-year tenure at the Jet Propulsion Laboratory in Pasadena, California. While in California, she was a part-time professor at the California State University Dominguez Hills, graduate school, and the Cal Poly Pomona, undergraduate programs. She holds a BS and MS in Electrical Engineering from the University Of Belgrade, Yugoslavia, and is a California registered Professional Electrical Engineer. She is Technical Advisor (Chair) to the US Technical Advisory Group (TAG) of the IEC Technical Committee, TC56, Dependability.

Meeting Location: MIT Lincoln Laboratory, 3 Forbes Road, Lexington, MA 02420

No Admission Charge