Software Development Process and Reliability – Canceled!

This Chapter Meeting has been canceled!

Reliability Society

Software Development Process and Reliability

Speaker: Milena Krasich

The software reliability improvement is a closed loop process with analytical tools selected to provide continuity of analyses. There are some major differences between software and hardware reliability growth test approach. During incremental agile development and reliability growth, the number of identified and mitigated SW faults is the objective measure, not the failure rate. The true final software failure frequency can be measured only when software is tested operated in its expected use profile.

This presentation shows a closed loop reliability growth planning and data analysis process which is mapped to the software development. The process is made of compatible analyses methods for planning and data analysis in stages of SW development to ensure continuity and simplicity of application, as well traceability.

Closing the loop of the entire process allows review and adjustment of the assumptions made for the process parameters during the planning of the software reliability growth.

Milena Krasich is a Senior Principal Systems Engineer in Raytheon Integrated Defense Systems, Whole Life Engineering, RAM Engineering Group, Marlborough, MA.

Prior to joining Raytheon, she was a Senior Technical Lead of Reliability Engineering in Design Quality Engineering of Bose Corporation, Automotive Systems Division after her five-year tenure at the Jet Propulsion Laboratory in Pasadena, CA. While in California, she was a part-time professor at the Cal State University Dominguez Hills, graduate program Master of Science in Quality Assurance (Reliability, Advanced Reliability and Statistical Quality Control), and Cal Poly Pomona, undergraduate programs. She holds a BS and MS in Electrical Engineering from the University of Belgrade, Yugoslavia, and is a California registered Professional Electrical Engineer. She is Technical Advisor (Chair) to the US Technical Advisory Group (TAG) to the IEC Technical Committee, TC56 – Dependability.

Meeting Location: MIT Lincoln Laboratory, 3 Forbes Rd, Lexington, Massachusetts, 02421

Directions to 3 Forbes Road, Lexington, MA:

• Take Route 128/I-95 to Exit 30B, Route 2A Westbound.
• At the first traffic light, turn left onto Forbes Road.
• Go to the end of the street.
• At the traffic circle, turn right.
• Go halfway around the traffic circle and turn into the parking lot for MIT Lincoln Laboratory.
• The main entrance is straight ahead, shared with “agenus”.