Reliability As Impacted by Phased-Array and Radar Breakthroughs

An IEEE AESS Distinguished Lecture

Improved Reliability results from recent developments and breakthroughs in Active Electronically Steered Arrays (AESAs) and radar including metamaterials, graphene, digital beam forming, micromachining, low cost arrays, signal processing will be presented.
Data will be presented on amazing reliability performance of Iridium (illustration below) breakthrough AESA satellite global voice communication system.

Few photos from recent travels to Florence, China, France and Saudi Arabia on work in this area will be shared.

Dr. Eli Brookner is a global radar authority known for his contributions to airborne, intelligence, space, air-traffic control and defense mission systems. Among his accomplishments is his leadership in designing advanced airport surveillance radars, making air travel safer. He is now retired from Raytheon Company.

An IEEE Life Fellow, Dr. Brookner has twice been chairman of the International Symposium on Phased Array Systems and Technology. He is the recipient of the IEEE Aerospace and Electronic Systems Society (AESS) Warren White Award for Excellence in Radar Engineering, an IEEE Centennial Medal and an IEEE Millennium Medal, the IEEE Educational Activities Board Meritorious Achievement Award and is a Distinguished Lecturer for the IEEE AESS.

This event is the Chapter’s annual past chairs dinner and monthly meeting. The past chairs dinner recognizes past chairs of the IEEE Boston Reliability Chapter for their years of dedication and contributions to the chapter. Traditionally, this meeting starts with social networking, followed by dinner & announcements, then a presentation on a current reliability engineering topic by a keynote speaker.

This meeting will be held on Wednesday, December 10th, 2014 at MIT Lincoln Laboratory, Lexington, MA. It will begin with personal networking at 5:30 PM. The annual dinner will be served at 6:00 PM. The presentation will follow the annual chapter announcements at 6:50 PM. IEEE members and non-members are welcome. There is no charge for the dinner or presentation but we request that you register to attend by Friday, December 5, so we can finalize dinner arrangements.

You can register on-line by visiting the Reliability Chapter website at http://www.ieee.org/bostonrel

MIT Lincoln Laboratory is located at 244 Wood Street, Lexington, MA 02413.

Directions to Lincoln Laboratory: (from Interstate-95 / Route 128)
From the north (southbound):
• Take Exit 31B and merge onto Routes 4/225 towards Bedford
• Stay in right lane and go 0.3 miles from exit.
• Use Right Turning Lane just before traffic light to access Hartwell Ave. at 1st Traffic Light.
• Follow Hartwell Ave. for about 1.2 miles to Wood St.
• Turn left onto Wood Street and drive 0.3 mile.
• Turn right into MIT Lincoln Laboratory at the Wood Street Gate
• Have a valid driver’s license to present to security:
• Attending the IEEE Reliability presentation in the cafeteria.
From the south (northbound)
• Take Exit 30B and merge onto Route 2A – Stay in right lane
• Go about 0.4 miles to second traffic light and turn right on to Mass. Ave (opposite Minuteman Tech.).
• Follow Mass. Ave for ~ 0.4 miles.
• Turn left onto Wood Street and drive for 1.0 mile.
• Turn left into MIT Lincoln Lab at the Wood Street Gate
• Have a valid driver’s license to present to security:
• Attending the IEEE Reliability presentation in the cafeteria.

Park in the Visitor Parking area. To get to the Cafeteria, proceed toward the Main Entrance of MIT Lincoln Laboratory, but before entering the building, proceed down the stairs hidden to the left of the Main Entrance. Turn right at the bottom of the stairs and enter the building through the Cafeteria entrance. The Cafeteria is located directly ahead.

Web map link: http://www.ll.mit.edu/about/map.html