“Keyence Inspection Solutions – Superior Analysis through Clearer Observation”

November 14, 2018 @ 5:30 pm – 7:00 pm America/New York Timezone
MIT Lincoln Laboratory
3 Forbes Rd
Lexington, MA 02421

Reliability Society

Alik Apelian – Area Product Sales Manager, Digital Microscope Team, Keyence Corporation of America

Keyence is a rapidly growing leader in factory automation products and turnkey inspection equipment. Their microscope and surface measurement systems ensure that their customers can meet increasing quality standards and guarantee the reliability of their products.

During our November meeting, two specialists from Keyence will discuss High-Resolution Microscope systems and how they are an asset in Reliability, Failure Analysis, and R&D. These systems are designed to allow the researcher or engineer to make better decisions through superior imaging and metrology with reduced subjectivity.

We will be detailing how these products are used for a variety of applications including counterfeit electronic detection. Multi-directional lighting and full focus stacking make it easy to identify these in a fraction of the time, and with greater confidence. It is estimated that 70-80% of all potential counterfeits can be caught with a thorough inspection. Counterfeit inspection techniques are still new for many in the industry.

We will also be breaking down the many surface roughness parameters, and why Ra isn’t always the best choice in analysis surface texture. Many companies are moving away from stylists and profilometers and toward laser scanning microscopes to get down to the true depth of a groove with 0.5nm resolution, and 87-degree slope angle detection.

Keyence will demonstrate 3 of their Microscope systems and discuss the value each one provides: A Digital Microscope, a Laser Scanning Confocal, and a 3D Measuring Macroscope. Keyence encourages attendees to bring samples to see the equipment in action after the meeting.
AUTHOR BIO: Alik started with Keyence in 2012 as product specialist for Digital Microscope and High Speed Camera. Since then, she has moved into management of a team of 5 who span that area.

Alik is a member of the IEEE Reliability Society and has spent some time on the Boston Chapter Advisory Board. She graduated from UMass Amherst in 2007 with an International Business degree.

Meeting Location: MIT Lincoln Laboratory, 3 Forbes Rd, Lexington, Massachusetts, 02421

Registration: click here:

Directions to 3 Forbes Road, Lexington, MA:
• Take Route 128/I-95 to Exit 30B, Route 2A Westbound.
• At the first traffic light, turn left onto Forbes Road.
• Go to the end of the street.
• At the traffic circle, turn right.
• Go halfway around the traffic circle and turn into the parking lot for MIT Lincoln Laboratory
• The main entrance is straight ahead, shared with “agenus”.