ESD System Level / Device Level Testing Pitfalls and Concerns

Reliability Society

Tom Meuse – Thermo Fisher Scientific

With all the different test standards and testing methods, system level and device level ESD testing can be confusing and lead to questionable results. Most system level tests rely on discharges from handheld simulators being brought into contact with different points on a complete “system”. These discharges can be affected by numerous issues, from environmental to human inconstancies during the testing. Device level testing, although better controlled can also lead to questionable results, due to inconstancies in the test requirements and misunderstanding of the results. We’ll review some of the pitfalls associated with the system level and device level testing methods and their impact on the product and protection designs. In addition, we’ll review some of the new approaches to system level design, looking at new “co-operation” methods between system and device ESD protection designers.

This event is sponsored by the IEEE Boston Reliability Society and the Northeast Chapter of the ESD Association (NE-ESDA).

Tom Meuse is an Applications/Product/Technology Engineer for the Compliance Test Solutions division of Thermo Fisher Scientific, which is located in Tewksbury MA, USA. He is responsible for the Thermo Scientific ESD and Latch-up test system operations and future product research. Tom is a member of the ESD Association Device Testing (WG-5.x) committee, chair of the ESDA’s WG14 System Level working group and a member of the JEDEC JC-14.1 Committee on Reliability Test Methods. He’s also a member of the Joint ESDA/JEDEC Device Testing work group and a contributing member to the Industry Council on ESD Target Levels. In addition, he’s also a Board Member of the Northeast Chapter of the ESD Association.

During Tom’s 30 plus year career, which began with KeyTek Instruments, he worked on Surge and ESD simulator designs, in both an engineering capacity and as the project manager on both system level and device level testers. He’s provided numerous technical seminars focusing on ESD/Latch-up testing and Standards Evolution and has authored and co-authored numerous papers on topics relating to ESD device level testing and ESD system design.

Meeting Information:

This meeting will be held from 5:30-7:00 PM on Wednesday, 10 October 2018 at 3 Forbes Road, Lexington, MA 02421. There is no charge for the refreshments or presentation. You do not need to belong to the IEEE or NE-ESDA to attend this event; however, we welcome your consideration of IEEE and NE-ESDA memberships as a career enhancing technical affiliations. Please register to attend by Friday, 5 October 2018 so we can plan the refreshments.

Registration Form:

Directions to 3 Forbes Road, Lexington, MA:

Take Route 128/I-95 to Exit 30B, Route 2A Westbound.
At the first traffic light, turn left onto Forbes Road.
Go to the end of the street.
At the traffic circle, turn right.
Go halfway around the traffic circle and turn into the parking lot for MIT Lincoln Laboratory.
The main entrance is straight ahead, shared with “agenus”.