ESD Device Sensitivity Trends and their Impact on Manufacturing Technology

Reliability Society – Co-sponsored by Northeastern ESD Association

Registration is now closed!

Later this year the ESDA will be publishing a new version of the ESD Technology Roadmap which will make projections of ESD device-level protection levels out to the year 2020. In this talk we will present a preview of this roadmap as well as other information about device protection capability and device and system-level testing. The implications of these trends on the development of new technologies such as 3D ICs and advanced automated processes will also be discussed.

Dr. Terry L. Welsher of Dangelmayer Associates, L.L.C.

Dr. Terry L. Welsher retired from Lucent Technologies-Bell Laboratories Engineering Research Center in 2001 as the Director of the Quality, Test & Reliability department. He began his career in Bell Labs in 1978 where he worked on electrical conduction mechanisms in insulating polymers and electrolytic corrosion failure mechanisms in electrical interconnection materials. In 1984 he was appointed Distinguished Member of Technical Staff for his work in these fields. In 1986 he was promoted to Technical Manager to re-constitute the Bell Laboratories core expertise in electrostatic discharge (ESD). The newly formed group proceeded to produce a string of ground-breaking contributions to the field and played a key role in advancing industry standards. In 1994, he broadened his group’s activities to all aspects of hardware reliability for Lucent Technologies with special emphasis in environmental stress testing (EST) and product reliability prediction and planning. In 1998 he was promoted to Director of the Quality, Test & Reliability Center of Excellence where he directed the development and deployment of product quality, test and reliability assurance practices for Lucent Technologies business units. This work included design for testability of integrated circuits, board and system level test and diagnosis and special techniques for testing of RF and optoelectronic systems and components. Dr. Welsher was Chairman of the ESD Association Standards Committee 1988-1989. He was Technical Program Chair in 1991, Vice General Chair in 1992 and General Chair in 1993 of the EOS/ESD Symposium. He served as member of the Symposium Board of Directors 1993-1995. He has also been active in quality standards and roadmapping activities with Sematech, the ESD Association and the JEDEC 14 Quality and Reliability Committee. He has also served on the Board of Directors of JEDEC. He holds a B.S. in Chemistry from Florida State University and Ph.D. in chemical physics from the University of Texas at Austin. He is author or co-author of thirty-five papers in solid state physics, applied mathematics, organic chemistry, electronics reliability and electrostatic discharge.

This meeting will be held on Wednesday, February 10, 2015 at MIT Lincoln Laboratory Forbes Road Location, 3 Forbes Road, Lexington, MA.

It will begin with personal networking at 5:30 PM. The presentation will follow at 6:00 PM.