Class 0 and Reliability ESD Case Studies
244 Wood Street
Lexington, MA 02421
USA
Reliability and NE-ESDA Event
Join us for this highly interactive tutorial and learn about reliability failures including latency as well as the complexity, customization and attention to detail required to successfully produce products utilizing ultra-sensitive Class 0 devices. Start to understand these issues now because there will be no “Class 0 Standard Practices” in the foreseeable future. The variables and complexity are far too great.
Case studies will include Medical reliability failures, Latency, Production and Military program stoppage, CCD installations, and MR Heads. One of the Class 0 Case Studies took place during ramp up of a Billion dollar product line when 100% failure rates brought production to a standstill. Another Case Study documents 22% failures rates with a good S20.20 program in place. A particularly interesting Class 0 case study will be presented on the installation of CCDs at the Gemini Observatory in Hawaii. These CCDs cost $175,000 each and did not have any input protection.
Ted Dangelmayer is the president of Dangelmayer Associates, L.L.C., and has assembled an ESD consulting team consisting of the foremost authorities in virtually all ESD areas of both product design and manufacturing. It is the only team with both globally recognized advanced technical expertise and operational manufacturing and research experience.
Ted Dangelmayer has held leadership positions such as Chairman of the Lucent Global ESD Leadership Team, President of the International ESD Association, Chairman of the ANSI/ESDA Standards Committee, and General Chairman of the EOS/ESD Symposium. Under Ted’s leadership, Lucent Technologies ¬ North Andover, MA, was the first site in the USA to become S20.20 certified. At the time, the Lucent site had 2,000,000 square feet of floor space and 12,000 employees. The lead DNV auditor was quoted as saying “I’ve audited literally hundreds of ESD programs and, without a doubt, the Lucent program is the best I have ever seen. It’s a world class benchmark, and you can quote me on that!” He has published numerous magazine articles, technical papers and two books, ESD PROGRAM MANAGEMENT.
Ted holds three patents, is NARTE Certified, and has successfully completed the ESD Association ANSI/ESDA S20.20 Course for Program Managers and Consultants. He is currently President of the Northeast Chapter of the ESD Association and a member of the ESD Association International Council of Education and 2003 Technical Program Committee.
This is a joint IEEE RelSoc and NE-ESDA event. This meeting will be held on Wednesday, January 14, 2015 at MIT Lincoln Laboratory, Lexington, MA. It will begin with personal networking at 5:30 PM. The presentation will follow at 6:00 PM. Refreshments, compliments of the Reliability and ESDA Chapters, will be available. You do not need to belong to IEEE or ESDA to attend this event; however we welcome your consideration of IEEE and ESDA memberships as career enhancing technical affiliations. We request that you register to attend by Friday, January 9, so we can plan the refreshments.
You can register on-line by visiting the Reliability Chapter website at http://www.ieee.org/bostonrel
MIT Lincoln Laboratory is located at 244 Wood Street, Lexington, MA 02421.
Directions to Lincoln Laboratory: (from Interstate-95 / Route 148)
From the north (southbound):
• Take Exit 31B and merge onto Routes 4/225 towards Bedford
• Stay in right lane and go 0.3 miles from exit.
• Use Right Turning Lane just before traffic light to access Hartwell Ave. at 1st Traffic Light.
• Follow Hartwell Ave. for about 1.2 miles to Wood St.
• Turn left onto Wood Street and drive 0.3 mile.
• Turn right into MIT Lincoln Laboratory at the Wood Street Gate
• Have a valid driver’s license to present to security:
• Attending the IEEE Reliability presentation in the cafeteria.
From the south (northbound)
• Take Exit 30B and merge onto Route 2A – Stay in right lane
• Go about 0.4 miles to second traffic light and turn right on to Mass. Ave (opposite Minuteman Tech.).
• Follow Mass. Ave for ~ 0.4 miles.
• Turn left onto Wood Street and drive for 1.0 mile.
• Turn left into MIT Lincoln Lab at the Wood Street Gate
• Have a valid driver’s license to present to security:
• Attending the IEEE Reliability presentation in the cafeteria.
Park in the Visitor Parking area. To get to the Cafeteria, proceed toward the Main Entrance of MIT Lincoln Laboratory, but before entering the building, proceed down the stairs hidden to the left of the Main Entrance. Turn right at the bottom of the stairs and enter the building through the Cafeteria entrance. The Cafeteria is located directly ahead.
Web map link: http://www.ll.mit.edu/about/map.html