Catching and Preventing More Defects, Earlier – Fall 2015

When:
December 17, 2015 @ 8:30 am – 5:00 pm America/New York Timezone
2015-12-17T08:30:00-05:00
2015-12-17T17:00:00-05:00
Where:
Crowne Plaza
15 Middlesex Canal Park Drive
Woburn, MA 01801
USA
Cost:
see below
Catching and Preventing More Defects, Earlier - Fall 2015 @ Crowne Plaza | Woburn | Massachusetts | United States

THIS COURSE HAS BEEN CANCELLED!

Speaker: Robin Goldsmith

Thursday, December 17th and Friday, December 18th

Location: Crowne Plaza Hotel, 15 Middlesex Canal Park Road, Woburn, MA

Decision (Run/Cancel) Date for this Courses is 7 Dec 2015

Payment received by 3 Dec

IEEE Members $415
Non-members $430

Payment received after 3 Dec

IEEE Members $430
Non-members $455

Phone 781-245-5405
email sec.boston@ieee.org
Fax 781-245-5406

Make Checks payable to:
IEEE Boston Section
One Centre Street, Suite 203
Wakefield, MA 01880

Course Summary

Catching and Preventing More Defects, and More Importantly, Earlier
2-Day Intensive Seminar Workshop
Win Testing Advocates by Helping Deliver Projects Faster, Cheaper, and Better

Testing is the main means of controlling risks that software does what it’s not supposed to do or doesn’t do what it’s supposed to do. Testing takes half of typical software projects, but few project–or test—managers know how to do it effectively. Thus, traditional testing typically is reactive, coming too late and taking too much effort, yet still missing many defects, especially showstoppers. This interactive workshop shows how Proactive Testing™ applies proven traditional test techniques and special more powerful methods in low-overhead no-busywork ways that enable doing more effective testing in less time, catching many ordinarily-overlooked showstopper and other defects earlier, while also overcoming traditional user, manager, and developer resistance to testing by cutting time, effort, and aggravation. To enhance learning, participants practice each key technique in a series of exercises with various aspects of a real case fact situation.

Participants will learn:

* A structured Proactive Testing model of testing that should be performed throughout the life cycle.
* Ways testing actually can cut time, effort, and aggravation for users, developers, and managers.
* Writing industry-accepted test plans and test designs that make testing easier and more reliable.
* Multiple techniques/checklists to design more thorough tests and discover overlooked conditions.
* Measurements for managing and improving test process effectiveness.
* Applying risk analysis and reusable testware to perform more of the important testing in less time.

WHO SHOULD ATTEND: This course has been designed for testing professionals and others who manage and perform testing of software products, and also for analysts, designers, and system/project managers who need to know how Proactive Testing™ can cut software development time and effort.

HOW TESTING CAN CUT EFFORT & TIME
Testing for correctness vs. testing for errors
Defect injection, detection, ejection metrics
Reactive testing—out of time, but not tests
Proactive Testing Life Cycle model
CAT-Scan Approach to find more errors
V-model and objectives of each test level
Dynamic, passive and active static testing
Developer vs. independent test group testing
Strategy—create fewer errors, catch more
Test activities that save the developer’s time
TEST PLANNING VALUE NOT BUSYWORK
Risk elements, relation to testing
Proactive vs. reactive risk analysis
IEEE Standard for Test Documentation
Enabling manageability, reuse, selectivity
Master Test Plan counterpart to project plan
Approach, use of automated tools
Entry/exit criteria, anticipating change
Exercise: Anticipating showstoppers
Risk-based way to define test units
Letting testing drive development
Preventing major cause of overruns
DETAILED TEST PLANNING
IEEE Standard on Unit Testing
Functional (Black Box) testing strategy
3-level top-down test planning and design
Exercise: Functionality matrix
Use cases, revealing overlooked conditions
Detailed Test Plan technical document
WHITE BOX (STRUCTURAL) TESTING
Structural (white box) degrees of coverage
Flowgraphing logic paths
Applying structural paths to business logic
Exercise: Defining use case test coverage
TEST DESIGN: BOTH VERB AND NOUN
Exercise: Disciplined brainstorming
Checklists find more overlooked conditions
Data formats, data and process models
Business rules, decision tables and trees
Equivalence classes and boundary values
Error guessing, condition combinations
Defect isolation, reproducibility,
Formal, informal Test Design Specifications
Exercise: Defining reusable test designs
Test Case Specifications vs. test data values
Writing test cases, script/matrix
MEASURING AND MANAGING TESTING
Defect reports that prompt suitable action
Projecting when software is good enough
Measuring testing effectiveness

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