Call the office for discounts on enrolling in multiple Doug Smith courses, this course, Failure Analysis, and Troubleshooting, Verification and Measurements in SI, 781-245-5405

A Fun and Educational ESD Seminar!

This seminar is unique in the ESD world. Characteristics of ESD, equipment design principles, and design troubleshooting techniques are covered. Demonstrations are used to illustrate most of the concepts being taught unlike most seminars which are taught through the use of visuals as the main medium. A large portion of class time is spent in demonstrations. Complicated math is avoided. This format makes the seminar more interesting to the students and helps them to achieve a deeper understanding of the material covered.

Emphasis is placed on delivering practical knowledge to design engineers and technicians that can be used immediately on the job. Learning is further enhanced by making the “dry” subject of ESD actually fun. This may be the only ESD seminar to makes the students laugh!

Description:

This seminar describes, in depth, ESD design, measurement, and troubleshooting principles. High frequency measurement techniques are used to reinforce these principles and to improve equipment ESD performance and improve the overall reliability of electronic systems.

Objectives and Benefits:

• Understand principles of system level ESD including new and important forms of ESD that are not covered in any standard yet are significant sources of system level upset.

• Learn characteristics of ESD that have direct and practical application to system level design.

• Learn principles of circuit and system design that enhance ESD immunity in electronic systems.

• Understand and apply high frequency measurement techniques to troubleshoot design problems.

• Relate ESD immunity to EMC system level performance and reliability.

• Learn construction techniques for useful laboratory apparatus that is useful for troubleshooting system level ESD problems.

• Learn what kinds of problems have occurred in the past and how they were fixed. See how ESD can cause system problems that mimic other types of problems.

Who Should Attend?

All circuit designers, design supervisors, EMC/ESD personnel.

Prerequisites:

College level course on circuit analysis is desirable although the seminar will be useful to those with two year technical degrees.

Instructional Mode:

Lecture/laboratory. About 50% of class time is devoted to experiments and demonstrations.

Major Topics:

• Properties of ESD

  High frequency content of ESD

  Hand metal vs. skin discharge

  Contact vs. air discharge

  Unusual forms of ESD

 

• Hardware design for ESD

  Enclosure design issues

  Mechanical design issues

  Electrical design issues

 

• Software design for ESD

  Processor issues

  I/O issues

  Memory issues

 

• Troubleshooting Techniques

Voltage measurements

Current measurements

Noise injection

Useful home-built test apparatus

Case histories

 

• Review of current standards activities

Course Presenter

Douglas Smith, Author of High Frequency Measurements and Noise in Electronic Circuits

Mr Smith held an FCC First Class Radiotelephone license by age 16 and a General Class amateur radio license at age 12. He received a B.E.E.E. degree from Vanderbilt University in 1969 and an M.S.E.E. degree from the California Institute of Technology in 1970. In 1970, he joined AT&T Bell Laboratories as a Member of Technical Staff. He retired in 1996 as a Distinguished Member of Technical Staff. From February 1996 to April 2000 he was Manager of EMC Development and Test at Auspex Systems in Santa Clara, CA. Mr. Smith currently is an independent consultant specializing in high frequency measurements, circuit/system design and verification, switching power supply noise and specifications, EMC, and immunity to transient noise. He is a Senior Member of the IEEE and a former member of the IEEE EMC Society Board of Directors.

His technical interests include high frequency effects in electronic circuits, including topics such as Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), and other forms of pulsed electromagnetic interference. He also has been involved with FCC Part 68 testing and design, telephone system analog and digital design, IC design, and computer simulation of circuits. He has been granted over 15 patents, several on measurement apparatus.

Mr Smith has lectured at Oxford University, Vanderbilt University, University of California, Berkeley, AT&T Bell Labs, and at many public and private seminars on high frequency measurements, circuit design, ESD, and EMC. He is author of the book High Frequency Measurements and Noise in Electronic Circuits. His very popular website, www.emcesd.com (www.dsmith.org), draws many thousands of visitors each month to see over 60 technical articles as well as other features.

All reference material, coffee breaks and lunch are included with the registration fee

Decision (Run/Cancel) Date for this Course is Wednesday, Nov. 1, 2006

Course Fee Schedule:

On-line Registration and Payment

On-line registration to this course is closed. If you would like to register for this course, you may do so by calling 781-245-5405 or you may register at Thermo Electron Corporation , One Lowell Research Center, Lowell MA on Thursday, November 9th between 8:00AM-8:30AM

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Maintained by R M Stelting

Updated Thursday August 16, 2007