Calendar

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ESD System Level / Device Level Testing Pitfalls and Concerns 5:30 pm
ESD System Level / Device Level Testing Pitfalls and Concerns @ MIT Lincoln Laboratory
Oct 10 @ 5:30 pm – 7:30 pm
ESD System Level / Device Level Testing Pitfalls and Concerns @ MIT Lincoln Laboratory  | Lexington | Massachusetts | United States
Reliability Society Tom Meuse – Thermo Fisher Scientific With all the different test standards and testing methods, system level and device level ESD testing can be confusing and lead to questionable results. Most system level tests rely on discharges from handheld simulators being brought into contact with different points on …
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“2D and 3D Printing; Changing Form Factors in Microwave Electronics” 5:00 pm
“2D and 3D Printing; Changing Form Factors in Microwave Electronics” @ Boxboro Regency Hotel & Conference Center
Oct 16 @ 5:00 pm – 8:00 pm
"2D and 3D Printing; Changing Form Factors in Microwave Electronics" @ Boxboro Regency Hotel & Conference Center  | Boxborough | Massachusetts | United States
Reliability Society, Microwave Theory and Techniques Society, iMAPS, and SMTA FEATURING Graduate Students from SUNY Binghamton, Worcester Polytechnic Institute, and UMASS Lowell, for an INTERACTIVE POSTER SESSION and Individual Presentations! Featured Presentation “2D and 3D Printing; Changing Form Factors in Microwave Electronics” Speaker: Craig Armiento, Ph.D., Director, Printed Electronics Research …
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